ATTO CUBE SYSTEMS

Introducing Low temperature nano-positioning systems…..
New path in the area of microscopy and micro/nano analysis…..

Low Temperature Physics Measurement System
Complete system solutions for low temperature research & development.

With this novel ultra-modular systems a variety of scanning probe microscopy (SPM) techniques as well as a probing station at low temperatures down to 300 mK can be covered within one single device.

NANOSCOPY
Scanning Probe Microscopes

The product range includes:

• Confocal Microscopes (CFM)


• Atomic Force Microscopes (AFM)


• Scanning Near-Field Optical Microscopes (SNOM)

With operating environments ranging from standard temperature and pressure conditions to low temperature (100mK), high vacuum, and high magnetic fields(15T).

NANOTOOLING
Vacuum 4 Probe Stations

For testing of nanostructures in closed chamber under controlled conditions like ultra high vacuum & low temperature.

NANOPOSITIONING
Ultra-Compact Positioners for atomic resolution and travel in the centimeter range

• Linear Positioners : Step Size down to 5nm


• Rotators : Step Size down to 0.5 m°


• Goniometers : Step Size down to 0.02 m°


• Scanners : Fine positioning range upto 20 µm